http://10.10.120.238:8080/xmlui/handle/123456789/224
Title: | Radiation Hardened and Leakage Power Attack Resilient 12T SRAM Cell for Secure Nuclear Environments |
Authors: | Mondal D. Naz S.F. Shah A.P. |
Keywords: | hardware security leakage power attack rhbd sram |
Issue Date: | 2023 |
Publisher: | Association for Computing Machinery |
Abstract: | Extremely energetic particles prevalent in the nuclear environment make memory cells prone to soft errors. Also, attackers extract secret data of SRAM cells via side-channel attacks (SCAs), and leakage power analysis attacks (LPAs) are a serious threat to security systems. This research indicates an extremely effective radiation-hardened and LPA-resilient (RHLR12T) SRAM cell that is both radiation resistant by design for nuclear applications and LPA-resilient. It offers better speed, enhanced writing stability and higher overlap percentage compared to other considered SRAM cells, such as 6T, Quatro, We-Quatro, and RHMD10T, utilizing 45nm CMOS technology at the supply voltage of 1.0V and 27-C operating temperature. The proposed cell gives 1.141× higher write stability, 1.55× lower write access time, 1.11× increased critical charge and 1.51× better overlap percentage than RHMD10T SRAM cell. © 2023 Owner/Author. |
URI: | https://dx.doi.org/10.1145/3583781.3590321 http://localhost:8080/xmlui/handle/123456789/224 |
ISBN: | 979-8400701252 |
Appears in Collections: | Conference Paper |
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