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Please use this identifier to cite or link to this item: http://10.10.120.238:8080/xmlui/handle/123456789/224
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dc.contributor.authorMondal D.en_US
dc.contributor.authorNaz S.F.en_US
dc.contributor.authorShah A.P.en_US
dc.date.accessioned2023-11-30T08:14:16Z-
dc.date.available2023-11-30T08:14:16Z-
dc.date.issued2023-
dc.identifier.isbn979-8400701252-
dc.identifier.otherEID(2-s2.0-85163153775)-
dc.identifier.urihttps://dx.doi.org/10.1145/3583781.3590321-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/224-
dc.description.abstractExtremely energetic particles prevalent in the nuclear environment make memory cells prone to soft errors. Also, attackers extract secret data of SRAM cells via side-channel attacks (SCAs), and leakage power analysis attacks (LPAs) are a serious threat to security systems. This research indicates an extremely effective radiation-hardened and LPA-resilient (RHLR12T) SRAM cell that is both radiation resistant by design for nuclear applications and LPA-resilient. It offers better speed, enhanced writing stability and higher overlap percentage compared to other considered SRAM cells, such as 6T, Quatro, We-Quatro, and RHMD10T, utilizing 45nm CMOS technology at the supply voltage of 1.0V and 27-C operating temperature. The proposed cell gives 1.141× higher write stability, 1.55× lower write access time, 1.11× increased critical charge and 1.51× better overlap percentage than RHMD10T SRAM cell. © 2023 Owner/Author.en_US
dc.language.isoenen_US
dc.publisherAssociation for Computing Machineryen_US
dc.sourceProceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSIen_US
dc.subjecthardware securityen_US
dc.subjectleakage power attacken_US
dc.subjectrhbden_US
dc.subjectsramen_US
dc.titleRadiation Hardened and Leakage Power Attack Resilient 12T SRAM Cell for Secure Nuclear Environmentsen_US
dc.typeConference Paperen_US
Appears in Collections:Conference Paper

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