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Showing results 1 to 7 of 7

Issue Date	Title	Author(s)
2021	BTI and Soft-Error Tolerant Voltage Bootstrapped Schmitt Trigger Circuit	Gupta N.; Shah A.P.; Vishvakarma S.K.
2021	Impact of negative bias temperature instability on single event transients in scaled logic circuits	Shah A.P.; Waltl M.
2023	A Makespan and Energy-Aware Scheduling Algorithm for Workflows under Reliability Constraint on a Multiprocessor Platform	Banerjee S.; Tekawade A.
2020	On-chip adaptive vdd scaled architecture of reliable sram cell with improved soft error tolerance	Gupta N.; Shah A.P.; Kumar R.S.; Gupta T.; Khan S.; Vishvakarma S.K.
2022	Series diode-connected current mirror based linear and sensitive negative bias temperature instability monitoring circuit	Bhootda N.; Yadav A.; Neema V.; Shah A.P.; Vishvakarma S.K.
2022	Survey, taxonomy, and methods of QCA-based design techniques - Part II: Reliability and security	Fazili M.M.; Shah M.F.; Naz S.F.; Shah A.P.
2021	Voltage Bootstrapped Schmitt Trigger based Radiation Hardened Latch Design for Reliable Circuits	Gupta N.; Agrawal N.; Singh Dhakad N.; Prasad Shah A.; Kumar Vishvakarma S.; Girard P.

Showing results 1 to 7 of 7