http://10.10.120.238:8080/xmlui/handle/123456789/837
Title: | RIS-Assisted SSK Modulation: Reflection Phase Modulation and Performance Analysis |
Authors: | Singh U. Bhatnagar M.R. Bansal A. |
Keywords: | Bit error rate Maximum likelihood detection Reconfigurable intelligent surface SSK modulation |
Issue Date: | 2022 |
Publisher: | Institute of Electrical and Electronics Engineers Inc. |
Abstract: | In this letter, we present a reconfigurable intelligent surface (RIS)-assisted space shift keying (SSK) modulation and reflection phase modulation (RPM) scheme, where RIS embeds its own information in the reflection phase shift of the reflected radio frequency (RF) signal. More specifically, the RIS simultaneously performs two tasks: i) reflecting the impinging RF signal with a discrete phase shift and ii) embedding the information bits in the phase shift. We perform joint detection for the RPM and SSK symbols using a maximum likelihood detector, and a unified analytical framework is presented for theoretical analysis of the average bit error rate (ABER) and ergodic capacity of the proposed scheme. All numerical results are thoroughly verified through Monte Carlo simulation. Numerical results reveal that the proposed scheme outperforms the conventional SSK scheme. © 1997-2012 IEEE. |
URI: | https://dx.doi.org/10.1109/LCOMM.2022.3157055 http://localhost:8080/xmlui/handle/123456789/837 |
ISSN: | 1089-7798 |
Appears in Collections: | Journal Article |
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