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Please use this identifier to cite or link to this item: http://10.10.120.238:8080/xmlui/handle/123456789/673
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dc.contributor.authorNaz S.F.en_US
dc.contributor.authorShah A.P.en_US
dc.contributor.authorGupta N.en_US
dc.date.accessioned2023-11-30T08:45:22Z-
dc.date.available2023-11-30T08:45:22Z-
dc.date.issued2023-
dc.identifier.issn0026-2692-
dc.identifier.otherEID(2-s2.0-85165161675)-
dc.identifier.urihttps://dx.doi.org/10.1016/j.mejo.2023.105888-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/673-
dc.description.abstractIn this paper, a new 12T Schmitt trigger based SRAM cell is proposed in 40 nm technology. The proposed SRAM cell is resilient to leakage power attack (LPA), which is one of the main concern in side-channel attack (SCA). The proposed SRAM cell is designed by incorporating two more transistors to the Schmitt Trigger based 10T SRAM cell and is having equal leakage current when the storage node (Q) is storing 0 and 1, thereby achieving the overall distribution overlap percentage of 97.5% as compared to 0.09% of overlap in case of Schmitt Trigger based 10T SRAM. The Hold Static Noise Margin (HSNM), Read Static Noise Margin (RSNM) and Write Margin (WM) of the proposed design are also increased by 38.14%, 58.11% and 20.29% respectively as compared to 6T. Moreover, the WTP of the LPAR 12T is 1.07× greater as compared to the conventional 6T SRAM cell. © 2023 Elsevier Ltden_US
dc.language.isoenen_US
dc.publisherElsevier Ltden_US
dc.sourceMicroelectronics Journalen_US
dc.subjectHardware securityen_US
dc.subjectLeakage power analysisen_US
dc.subjectSchmitt triggeren_US
dc.subjectSide channel attacken_US
dc.subjectSRAMen_US
dc.titleLeakage power attack resilient Schmitt trigger based 12T symmetric SRAM cellen_US
dc.typeJournal Articleen_US
Appears in Collections:Journal Article

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