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Please use this identifier to cite or link to this item: http://10.10.120.238:8080/xmlui/handle/123456789/478
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dc.contributor.authorFazili M.M.en_US
dc.contributor.authorShah M.F.en_US
dc.contributor.authorNaz S.F.en_US
dc.contributor.authorShah A.P.en_US
dc.date.accessioned2023-11-30T08:35:34Z-
dc.date.available2023-11-30T08:35:34Z-
dc.date.issued2022-
dc.identifier.issn0026-2692-
dc.identifier.otherEID(2-s2.0-85134176152)-
dc.identifier.urihttps://dx.doi.org/10.1016/j.mejo.2022.105502-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/478-
dc.description.abstractThe penchant for almost all modern-day devices is high data and communication security. To achieve the highest standard of security, hardware-based encryption architectures like true random number generators (TRNG) and physically unclonable functions (PUF) supersede attack deterrence to any known software-based cryptography algorithm. The keys generated are random and unpredictable. This paper proposes a new architecture for TRNG in quantum-dot cellular automata (QCA) technology using feedback and feed-forward D flip-flop arrangement with small delay defects. A new optimized negative edge-triggered D flip-flop is presented using only 25-QCA cells. This unique and carefully curated TRNG structure ensures the generated output bits are highly unpredictable and truly random in behavior. Furthermore, 15 statistical tests designed for random number generators are performed. These test results validate the random nature of the generated outputs and unpredictable behavior of the proposed TRNG design. The energy dissipation analysis shows a significant improvement of 49.6% for energy dissipation per bit compared to existing designs. © 2022 Elsevier Ltden_US
dc.language.isoenen_US
dc.publisherElsevier Ltden_US
dc.sourceMicroelectronics Journalen_US
dc.subjectHardware securityen_US
dc.subjectQCAen_US
dc.subjectRandomnessen_US
dc.subjectTrue random number generatoren_US
dc.titleNext generation QCA technology based true random number generator for cryptographic applicationsen_US
dc.typeJournal Articleen_US
Appears in Collections:Journal Article

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