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  2. IITJmu Scholarly Publications
  3. Editorial
Please use this identifier to cite or link to this item: http://10.10.120.238:8080/xmlui/handle/123456789/360
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dc.contributor.authorShah A.P.en_US
dc.contributor.authorDasgupta S.en_US
dc.date.accessioned2023-11-30T08:29:49Z-
dc.date.available2023-11-30T08:29:49Z-
dc.date.issued2023-
dc.identifier.issn0925-1030-
dc.identifier.otherEID(2-s2.0-85170028459)-
dc.identifier.urihttps://dx.doi.org/10.1007/s10470-023-02184-6-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/360-
dc.description.abstract[No abstract available]en_US
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.sourceAnalog Integrated Circuits and Signal Processingen_US
dc.titleSpecial issue: 26th international symposium on VLSI design and test 2022en_US
dc.typeEditorialen_US
Appears in Collections:Editorial

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