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IDR@IIT Jammu
Browsing by Subject Reliability
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Showing results 1 to 4 of 4
Issue Date
Title
Author(s)
2020
Impact of Aging on Soft Error Susceptibility in CMOS Circuits
Shah A.P.
;
Girard P.
2021
Soft error hardened voltage bootstrapped Schmitt trigger design for reliable circuits
Gupta N.
;
Shah A.P.
;
Kumar R.S.
;
Raut G.
;
Dhakad N.S.
;
Vishvakarma S.K.
2022
A survey on mining and analysis of uncertain graphs
Banerjee S.
2023
Transmitter Selection for Secrecy in Frequency-Selective Fading with Multiple Eavesdroppers and Wireless Backhaul Links
Kotwal S.B.
;
Kundu C.
;
Modem S.
;
Flanagan M.F.
