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IDR@IIT Jammu
Browsing by Subject ISCAS'85 benchmark circuit
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Showing results 1 to 2 of 2
Issue Date
Title
Author(s)
2020
Impact of Aging on Soft Error Susceptibility in CMOS Circuits
Shah A.P.
;
Girard P.
2021
Impact of negative bias temperature instability on single event transients in scaled logic circuits
Shah A.P.
;
Waltl M.
